Publication Details

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

RŮŽIČKA, R.; ŠIMEK, V.; SEKANINA, L. Behavior of CMOS Polymorphic Circuits in High Temperature Environment. Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems. Cottbus: IEEE Computer Society, 2011. p. 447-452. ISBN: 978-1-4244-9753-9.
Czech title
Chování polymorfních obvodů CMOS při vysokých teplotách
Type
conference paper
Language
English
Authors
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)
Šimek Václav, Ing. (DCSY)
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
Keywords

Polymorphic digital circuits, polymorphic gates, reconfigurable circuits, temperature-aware design.

Abstract

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.

Published
2011
Pages
447–452
Proceedings
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
978-1-4244-9753-9
Publisher
IEEE Computer Society
Place
Cottbus
BibTeX 
@inproceedings{BUT76318,
  author="Richard {Růžička} and Václav {Šimek} and Lukáš {Sekanina}",
  title="Behavior of CMOS Polymorphic Circuits in High Temperature Environment",
  booktitle="Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2011",
  pages="447--452",
  publisher="IEEE Computer Society",
  address="Cottbus",
  isbn="978-1-4244-9753-9",
  url="https://www.fit.vut.cz/research/publication/9581/"
}
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