Publication Details

TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path

STRNADEL, J. TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path. Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society, 2008. p. 865-872. ISBN: 978-0-7695-3277-6.
Czech title
TASTE: Soubor prostředků a otevřených knihoven pro analýzu testovatelnosti číslicových obvodů
Type
conference paper
Language
English
Authors
URL
Keywords

digital, circuit, testability, analysis, scan, transparency, netlist, graph, model, searching, marking, reachability, library, component, template

Abstract

Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a customer. Estimation of testability parameter strongly depends on how accurate information utilized for the estimation by a testability analysis method is. In the paper, two results of our previous, long-term research in the area of digital circuit testability analysis are summarized: principle of our testability analysis engine and libraries used to store the information outgoing from transparency models. The engine is general and the run-time and accuracy of its results strongly depends on the information stored in the libraries. If simple transparency model is utilized, information about circuit testability could be far away from real state of the circuit. Otherwise, testability information can approximate so serious parameter such as fault-coverage factor.

Published
2008
Pages
865–872
Proceedings
Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools
ISBN
978-0-7695-3277-6
Publisher
IEEE Computer Society
Place
Los Alamitos
BibTeX
@inproceedings{BUT27714,
  author="Josef {Strnadel}",
  title="TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path",
  booktitle="Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools",
  year="2008",
  pages="865--872",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  isbn="978-0-7695-3277-6",
  url="https://www.fit.vut.cz/research/publication/8632/"
}
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