Publication Details

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

RŮŽIČKA, R. A Complex Approach to Digital RTL Circuit Testability - iFCoRT System. Informal Digest of Papers of the IEEE European Test Symposium 2005. Tallinn: Tallinn University of Technology, 2005. p. 156-157.

Czech title

Komplexní přístup k testovatelnosti číslicového obvodu na úrovni RT - Systém iFCoRT

Type

conference paper

Language

English

Authors

Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)

Keywords

RT level diagnostics, i paths, design-for-testability

Abstract

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

Published

2005

Pages

156–157

Proceedings

Informal Digest of Papers of the IEEE European Test Symposium 2005

Publisher

Tallinn University of Technology

Place

Tallinn

BibTeX

@inproceedings{BUT21509,
  author="Richard {Růžička}",
  title="A Complex Approach to Digital RTL Circuit Testability - iFCoRT System",
  booktitle="Informal Digest of Papers of the IEEE European Test Symposium 2005",
  year="2005",
  pages="156--157",
  publisher="Tallinn University of Technology",
  address="Tallinn"
}