Publication Details

Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits

VAŠÍČEK, Z. Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits. Microelectronics Reliability, 2019, vol. 2019, no. 99, p. 1-36. ISSN: 0026-2714.

Type

journal article

Language

English

Authors

Vašíček Zdeněk, doc. Ing., Ph.D. (DCSY)

Published

2019

Pages

1–36

Journal

Microelectronics Reliability, vol. 2019, no. 99, ISSN 0026-2714

BibTeX

@article{BUT168515,
  author="Zdeněk {Vašíček}",
  title="Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits",
  journal="Microelectronics Reliability",
  year="2019",
  volume="2019",
  number="99",
  pages="1--36",
  issn="0026-2714"
}