Detail publikace

Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits

VAŠÍČEK, Z. Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits. Microelectronics Reliability, 2019, vol. 2019, no. 99, p. 1-36. ISSN: 0026-2714.
Typ
článek v časopise
Jazyk
anglicky
Autoři
Vašíček Zdeněk, doc. Ing., Ph.D. (UPSY)
Rok
2019
Strany
1–36
Časopis
Microelectronics Reliability, roč. 2019, č. 99, ISSN 0026-2714
BibTeX 
@article{BUT168515,
  author="Zdeněk {Vašíček}",
  title="Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits",
  journal="Microelectronics Reliability",
  year="2019",
  volume="2019",
  number="99",
  pages="1--36",
  issn="0026-2714"
}
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