Publication Details

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN, O.; KOTÁSEK, Z. Random Test Generation Through a Probabilistic Constrained Grammar. INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť: 2018. p. 5-8.
Type
conference paper
Language
English
Authors
Čekan Ondřej, Ing., Ph.D. (UFYZ)
Kotásek Zdeněk, doc. Ing., CSc.
Abstract

The paper introduces a probabilistic constrained grammar which is a  newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Published
2018
Pages
5–8
Proceedings
INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Place
Budapešť
BibTeX 
@inproceedings{BUT168460,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="Random Test Generation Through a Probabilistic Constrained Grammar",
  booktitle="INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2018",
  pages="5--8",
  address="Budapešť"
}
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