Detail publikace

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN, O.; KOTÁSEK, Z. Random Test Generation Through a Probabilistic Constrained Grammar. INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť: 2018. p. 5-8.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Čekan Ondřej, Ing., Ph.D. (UFYZ)
Kotásek Zdeněk, doc. Ing., CSc.
Abstrakt

The paper introduces a probabilistic constrained grammar which is a  newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Rok
2018
Strany
5–8
Sborník
INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Konference
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2018, Hotel NH Budapest City, Budapešť, HU
Místo
Budapešť
BibTeX 
@inproceedings{BUT168460,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="Random Test Generation Through a Probabilistic Constrained Grammar",
  booktitle="INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2018",
  pages="5--8",
  address="Budapešť"
}
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