Publication Details

Special Session: How Approximate Computing impacts Verification, Test and Reliability

SEKANINA, L.; VAŠÍČEK, Z.; BOSIO, A.; TRAIOLA, M.; RECH, P.; OLIVEIRA, D.; FERNANDES, F.; DI CARLO, S. Special Session: How Approximate Computing impacts Verification, Test and Reliability. 2018 IEEE 36th VLSI Test Symposium. San Francisco: IEEE Computer Society, 2018. p. 0-0. ISBN: 978-1-5386-3774-6.
Czech title
Speciální sekce: Jak aproximativní počítání ovlivňuje verifikaci, testování a spolehlivost
Type
abstract
Language
English
Authors
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
Vašíček Zdeněk, doc. Ing., Ph.D. (DCSY)
BOSIO, A.
TRAIOLA, M.
RECH, P.
OLIVEIRA, D.
FERNANDES, F.
DI CARLO, S.
Keywords

digital circuit, approximate computing, verification, test, reliability

Abstract

A new design paradigm -- approximate computing -- was established to investigate how computer systems can be made better -- more energy efficient, faster, and less complex -- by relaxing the requirement that they are exactly correct. The purpose of this special session is to introduce and discuss how approximate computing can and how impact the verification, the test and the reliability of digital circuits. The presentations of the special session will propose two views: (i): how the approximate computing paradigm impacts the design and manufacturing flow of integrated circuits; (ii): how the verification, testing and reliability disciplines can be exploited in the approximate computing paradigms.

Published
2018
Pages
1
Book
2018 IEEE 36th VLSI Test Symposium
ISBN
978-1-5386-3774-6
Publisher
IEEE Computer Society
Place
San Francisco
DOI
10.1109/VTS.2018.8368628
UT WoS
000435280400009
EID Scopus
2-s2.0-85048364082
BibTeX 
@misc{BUT155724,
  author="SEKANINA, L. and VAŠÍČEK, Z. and BOSIO, A. and TRAIOLA, M. and RECH, P. and OLIVEIRA, D. and FERNANDES, F. and DI CARLO, S.",
  title="Special Session: How Approximate Computing impacts Verification, Test and Reliability",
  booktitle="2018 IEEE 36th VLSI Test Symposium",
  year="2018",
  pages="1",
  publisher="IEEE Computer Society",
  address="San Francisco",
  doi="10.1109/VTS.2018.8368628",
  isbn="978-1-5386-3774-6",
  url="https://www.fit.vut.cz/research/publication/11726/",
  note="abstract"
}
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