Publication Details

On the Automatic Design of Testable Circuits

SEKANINA, L.; RŮŽIČKA, R. On the Automatic Design of Testable Circuits. Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems. Poznań: Publishing House of Poznan University of Technology, 2003. p. 299-300. ISBN: 83-7143-557-6.
Czech title
Příspěvek k automatizovanému návrhu testovatelných obvodů
Type
conference paper
Language
English
Authors
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)
Keywords

Evolutionary design, testability, digital circuits

Abstract

An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.

Annotation

An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.

Published
2003
Pages
299–300
Proceedings
Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems
ISBN
83-7143-557-6
Publisher
Publishing House of Poznan University of Technology
Place
Poznań
BibTeX 
@inproceedings{BUT13960,
  author="Lukáš {Sekanina} and Richard {Růžička}",
  title="On the Automatic Design of Testable Circuits",
  booktitle="Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems",
  year="2003",
  pages="299--300",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznań",
  isbn="83-7143-557-6"
}
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