Publication Details

The Evaluation Platform for Testing Fault-Tolerance Methodologies in Electro-mechanical Applications

PODIVÍNSKÝ, J.; ČEKAN, O.; ZACHARIÁŠOVÁ, M.; KOTÁSEK, Z. The Evaluation Platform for Testing Fault-Tolerance Methodologies in Electro-mechanical Applications. Microprocessors and Microsystems, 2015, vol. 39, no. 8, p. 1215-1230. ISSN: 0141-9331.
Czech title
Platforma pro testování fault-tolerant metodik v elektromechanických aplikacích
Type
journal article
Language
English
Authors
URL
Keywords

Fault Tolerance, Electro-mechanical Systems, Fault Injection, Single Event Upset, Functional verification

Abstract

The aim of this paper is to present a new platform for estimating the fault-tolerance quality of electro-mechanical applications based on FPGAs. We demonstrate one working example of such EM application that was evaluated using our platform: the mechanical robot and its electronic controller in an FPGA. Different building blocks of the electronic robot controller allow to model different effects of faults on the whole mission of the robot (searching a path in a maze). In the experiments, the mechanical robot is simulated in the simulation environment, where the effects of faults injected into its controller can be seen. In this way, it is possible to differentiate between the fault that causes the failure of the system and the fault that only decreases the performance. Further extensions of the platform focus on the interconnection of the platform with the functional verification environment working directly in FPGA that allows automation and speed-up of checking the correctness of the system after the injection of faults.

Published
2015
Pages
1215–1230
Journal
Microprocessors and Microsystems, vol. 39, no. 8, ISSN 0141-9331
DOI
UT WoS
000366879500056
EID Scopus
BibTeX
@article{BUT119932,
  author="Jakub {Podivínský} and Ondřej {Čekan} and Marcela {Zachariášová} and Zdeněk {Kotásek}",
  title="The Evaluation Platform for Testing Fault-Tolerance Methodologies in Electro-mechanical Applications",
  journal="Microprocessors and Microsystems",
  year="2015",
  volume="39",
  number="8",
  pages="1215--1230",
  doi="10.1016/j.micpro.2015.05.011",
  issn="0141-9331",
  url="http://www.sciencedirect.com/science/article/pii/S0141933115000630"
}
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