Result Details

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V. 28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Lyon: Institute of Electrical and Electronics Engineers, 2025. 168 p. ISBN: 979-8-3315-2801-0.
Type
conference proceedings
Language
English
Authors
BOSIO, A.
BERNARDI, P.
TRAIOLA, M.
Mrázek Vojtěch, Ing., Ph.D., DCSY (FIT)
Abstract

This proceedings contains reviewed papers accepted for publication and
presentation at the 28th International Symposium on Design and Diagnostics of
Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has
continued to provide a forum for exchanging ideas, discussing research results,
and presenting practical applications in the areas of design, test, and diagnosis
of electronic circuits and systems.

Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Published
2025
Pages
168
Conference
International Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
979-8-3315-2801-0
Publisher
Institute of Electrical and Electronics Engineers
Place
Lyon
DOI
10.1109/DDECS63720.2025
BibTeX 
@proceedings{BUT197714,
  editor="BOSIO, A. and BERNARDI, P. and TRAIOLA, M. and MRÁZEK, V.",
  title="28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2025",
  pages="168",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Lyon",
  doi="10.1109/DDECS63720.2025",
  isbn="979-8-3315-2801-0"
}
Projects
Application-specific HW/SW architectures and their applications, BUT, Vnitřní projekty VUT, FIT-S-23-8141, start: 2023-03-01, end: 2026-02-28, running
Research groups
Evolvable Hardware Research Group (RG EHW)
Departments
Department of Computer Systems (DCSY)
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