Publication Details
The Unified Approach to Processor Testing
DRÁBEK, V. The Unified Approach to Processor Testing. CE&I, Sci. Conf., Košice-Herlany, Slovakia. Košice-Herlany: unknown, 1999. p. 192-195. ISBN: 80-88922-05-4.
Type
conference paper
Language
English
Authors
Abstract
The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.
Annotation
The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.
Published
1999
Pages
192–195
Proceedings
CE&I, Sci. Conf., Košice-Herlany, Slovakia
ISBN
80-88922-05-4
Publisher
unknown
Place
Košice-Herlany
BibTeX
@inproceedings{BUT192309,
author="Vladimír {Drábek}",
title="The Unified Approach to Processor Testing",
booktitle="CE&I, Sci. Conf., Košice-Herlany, Slovakia",
year="1999",
pages="192--195",
publisher="unknown",
address="Košice-Herlany",
isbn="80-88922-05-4"
}