Data Dependent I Path and their Utilisation in DFT

Czech title

Datově závislé i cesty a jejich využití při snadno testovatelném návrhu obvodů

Type

conference paper

Language

English

Authors

Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)

Keywords

i path, design-for-testability, i mode, data dependent i mode

Abstract

This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.

Annotation

This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.

Published

2000

Pages

228–230

Proceedings

Sborník prací studentů a doktorandů FEI VUT

ISBN

80-7204-155-X

Publisher

Akademické nakladatelství CERM

Place

Brno

BibTeX

@inproceedings{BUT191625,
  author="Richard {Růžička}",
  title="Data Dependent I Path and their Utilisation in DFT",
  booktitle="Sborník prací studentů a doktorandů FEI VUT",
  year="2000",
  pages="228--230",
  publisher="Akademické nakladatelství CERM",
  address="Brno",
  isbn="80-7204-155-X"
}