Publication Details

RT Level Testability Analysis to Reduce Test Application Time

KOTÁSEK, Z.; ZBOŘIL, F. RT Level Testability Analysis to Reduce Test Application Time. Proceedings of the EUROMICRO 97. Budapest: unknown, 1997. p. 104-111. ISBN: 0-8186-8129-2.

Czech title

Analýza testovatelnosti na úrovni RT k redukci času testu

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.
Zbořil František, doc. Ing., CSc. (DITS)

Keywords

RT Level Testability Analysis, Element Classification, PROLOG

Abstract

The paper describes the research activities the goal of which is to develop a methodology that solves the problem of the RT level testability analysis in a complex way. On the basis of the RT level testability analysis the reduction in test application time can be achieved. A new model of RT level elements classification for the purposes of the RT level testability analysis is described. The prescription for an RTL circuit transformation to a labelled directed graph and its representation in PROLOG environment are presented. The methodology for the RT level testability analysis and the principles of its implementation are described.

Published

1997

Pages

104–111

Proceedings

Proceedings of the EUROMICRO 97

ISBN

0-8186-8129-2

Publisher

unknown

Place

Budapest

BibTeX

@inproceedings{BUT191445,
  author="Zdeněk {Kotásek} and František {Zbořil}",
  title="RT Level Testability Analysis to Reduce Test Application Time",
  booktitle="Proceedings of the EUROMICRO 97",
  year="1997",
  pages="104--111",
  publisher="unknown",
  address="Budapest",
  isbn="0-8186-8129-2"
}