Publication Details

A Probabilistic Context-Free Grammar Based Random Test Program Generation

ČEKAN, O.; KOTÁSEK, Z. A Probabilistic Context-Free Grammar Based Random Test Program Generation. In Proceedings of 20th Euromicro Conference on Digital System Design. Vídeň: Technical University Wien, 2017. p. 356-359. ISBN: 978-1-5386-2145-5.
Czech title
Náhodné generování testovacích programů založené na pravděpodobnostní bezkontextové gramatice
Type
conference paper
Language
English
Authors
Čekan Ondřej, Ing., Ph.D. (UFYZ)
Kotásek Zdeněk, doc. Ing., CSc.
Keywords

Probabilistic Context-Free Grammar, Random Test Program Generation, Stimulus, Constraint

Abstract

The aim of this paper is to show the use of a probabilistic context-free grammar in the domain of stimulus generation, especially random test program generation for processors. Nowadays, the randomly constructed test stimuli are largely applied in functional verification to verify the proper design and final implementation of systems. Context-free grammar cannot be used by itself in this case, because conditions for instructions of the program are changing during the generation. Therefore, there is a need to introduce additional logic in the form of constraints. Constraints guarantee the continuous changes of probabilities in the grammar and their application in order to preserve the validity of the program. The use of the grammar system provides a formal description of the stimuli, while the connection with constraints allows for the wide use in various systems. Experiments demonstrate that this approach is competitive with a conventional approach.

Published
2017
Pages
356–359
Proceedings
Proceedings of 20th Euromicro Conference on Digital System Design
ISBN
978-1-5386-2145-5
Publisher
Technical University Wien
Place
Vídeň
DOI
UT WoS
000427097100050
EID Scopus
BibTeX
@inproceedings{BUT144432,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="A Probabilistic Context-Free Grammar Based Random Test Program Generation",
  booktitle="Proceedings of 20th Euromicro Conference on Digital System Design",
  year="2017",
  pages="356--359",
  publisher="Technical University Wien",
  address="Vídeň",
  doi="10.1109/DSD.2017.26",
  isbn="978-1-5386-2145-5",
  url="https://www.fit.vut.cz/research/publication/11426/"
}
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