Publication Details

Overview of the testing environment for the embedded systems

DOLÍHAL, L.; HRUŠKA, T. Overview of the testing environment for the embedded systems. Proceedings of The third International Conference on Green Computing, Technology and Innovation. Kuala Lumpur: The Society of Digital Information and Wireless Communications, 2015. p. 55-59. ISBN: 978-1-941968-15-4.
Czech title
Přehled testovacího systému pro vestavěné systémy
Type
conference paper
Language
English
Authors
Dolíhal Luděk, Ing., Ph.D.
Hruška Tomáš, prof. Ing., CSc. (DIFS)
Keywords

Embedded systems testing, C library, compiler testing, simulation, hardware/software co-design, integration, Newlib, Lissom, Codasip.

Abstract

For testing of automatically generated C compiler for embedded systems on simulator, it is useful to have a C library support. Testing programs written in C very often use I/O operations and other functions provided by the C library. Hence not having the library, the number of programs that can be executed is very limited. But the C library can be used for the wide variety of tests not just for the C compiler. We will try to point out the role of the library in the whole process of testing and give an overview of the testing system that is used for testing of the complex embedded systems.

Published
2015
Pages
55–59
Proceedings
Proceedings of The third International Conference on Green Computing, Technology and Innovation
ISBN
978-1-941968-15-4
Publisher
The Society of Digital Information and Wireless Communications
Place
Kuala Lumpur
BibTeX 
@inproceedings{BUT120393,
  author="Luděk {Dolíhal} and Tomáš {Hruška}",
  title="Overview of the testing environment for the embedded systems",
  booktitle="Proceedings of The third International Conference on Green Computing, Technology and Innovation",
  year="2015",
  pages="55--59",
  publisher="The Society of Digital Information and Wireless Communications",
  address="Kuala Lumpur",
  isbn="978-1-941968-15-4"
}
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