Publication Details

Application of Evolutionary Algorithms for Optimization of Regression Suites

KEKELYOVÁ, M.; ZACHARIÁŠOVÁ, M.; KOTÁSEK, Z.; HRUŠKA, T. Application of Evolutionary Algorithms for Optimization of Regression Suites. In IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Belgrade: IEEE Computer Society, 2015. p. 91-94. ISBN: 978-1-4799-6779-7.
Czech title
Aplikace evolučního algoritmu pro optimalizaci regresních testů
Type
conference paper
Language
English
Authors
Belešová Michaela, Ing.
Zachariášová Marcela, Ing., Ph.D. (DCSY)
Kotásek Zdeněk, doc. Ing., CSc.
Hruška Tomáš, prof. Ing., CSc. (DIFS)
Keywords

genetic algorithm optimization regression tests

Abstract

Regression test suites are necessary to ensure that changes to the system made after bug fixes or reimplementation have not broken the intended functionality. However, because of the complexity of current hardware systems, it is desirable to have optimized regression suites that provide the highest verification coverage with minimal simulation time and resources. In this paper, we introduce a coverage-directed optimization algorithm for creating optimized regression suites from verification stimuli that were evaluated in simulation-based verification environment. The results of our experiments show that the quality and the size of the final regression suites are significantly improved in comparison to the original test suit. For our experimental system, we were able to eliminate 94.4% redundant stimuli from the original test suite while retaining the same level of functional coverage.

Published
2015
Pages
91–94
Proceedings
IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
978-1-4799-6779-7
Publisher
IEEE Computer Society
Place
Belgrade
DOI
EID Scopus
BibTeX
@inproceedings{BUT119863,
  author="Michaela {Belešová} and Marcela {Zachariášová} and Zdeněk {Kotásek} and Tomáš {Hruška}",
  title="Application of Evolutionary Algorithms for Optimization of Regression Suites",
  booktitle="IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2015",
  pages="91--94",
  publisher="IEEE Computer Society",
  address="Belgrade",
  doi="10.1109/DDECS.2015.42",
  isbn="978-1-4799-6779-7"
}
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