Publication Details

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

ZACHARIÁŠOVÁ, M.; BOLCHINI, C.; KOTÁSEK, Z. Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability. Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale. Avignon: COST, European Cooperation in Science and Technology, 2013. p. 35-38. ISBN: 978-2-11-129175-1.

Czech title

Analýza a porovnání funkční verifikace a ATPG pro testování spolehlivosti

Type

conference paper

Language

English

Authors

Zachariášová Marcela, Ing., Ph.D. (DCSY)
Bolchini Cristiana
Kotásek Zdeněk, doc. Ing., CSc.

Keywords

ATPG, functional verification.

Abstract

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order to create a new promising approach for testing reliable systems.

Published

2013

Pages

35–38

Proceedings

Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale

ISBN

978-2-11-129175-1

Publisher

COST, European Cooperation in Science and Technology

Place

Avignon

BibTeX

@inproceedings{BUT103529,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  booktitle="Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale",
  year="2013",
  pages="35--38",
  publisher="COST, European Cooperation in Science and Technology",
  address="Avignon",
  isbn="978-2-11-129175-1"
}