Publication Details

Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations

HAVEL, J.; HEROUT, A.; JURÁNKOVÁ, M. Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations. PATTERN RECOGNITION LETTERS, 2013, vol. 2013, no. 34, p. 703-708. ISSN: 0167-8655.
Czech title
Úběžníky v zobrazeních bodů na přímky a jiných parametrizacích přímek
Type
journal article
Language
English
Authors
Havel Jiří, Ing., Ph.D. (CM-SFE)
Herout Adam, prof. Ing., Ph.D. (DCGM)
Juránková Markéta, Ing., Ph.D. (DCGM)
Keywords

line parameterization, Hough transform, vanishing points, camera calibration

Abstract

Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated. The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.

Published
2013
Pages
703–708
Journal
PATTERN RECOGNITION LETTERS, vol. 2013, no. 34, ISSN 0167-8655
DOI
10.1016/j.patrec.2013.01.020
BibTeX 
@article{BUT103449,
  author="Jiří {Havel} and Adam {Herout} and Markéta {Juránková}",
  title="Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations",
  journal="PATTERN RECOGNITION LETTERS",
  year="2013",
  volume="2013",
  number="34",
  pages="703--708",
  doi="10.1016/j.patrec.2013.01.020",
  issn="0167-8655"
}
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