Ondřej Novák

Publikace

• 2019

  STAMENKOVIC, Z.; BOSIO, A.; CSEREY, G.; NOVÁK, O.; PLESKACZ, W.; SEKANINA, L.; STEININGER, A.; STOJANOVIC, G.; STOPJAKOVÁ, V. International Symposium on Design and Diagnostics of Electronic Circuits and Systems. In 2019 IEEE International Test Conference. Washington, DC: Institute of Electrical and Electronics Engineers, 2019. p. 1-4. ISBN: 978-1-7281-4823-6. Detail