Detail výsledku

Influence of higher noise level of measured voltages on error of signal reconstruction

DĚDKOVÁ, J.; BACHOREC, T.; STEINBAUER, M.; REZ, J. Influence of higher noise level of measured voltages on error of signal reconstruction. In IC - SPETO 2007. Wydrukowano w Zakladzie Graficznym Politechniki Slaskiej w Gliwicach, 2007. p. 197-198. ISBN: 978-83-85940-29-6.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Dědková Jarmila, prof. Ing., CSc., UTEE (FEKT)
Bachorec Tibor, Ing., Ph.D., UTEE (FEKT)
Steinbauer Miloslav, doc. Ing., Ph.D., UETE (FEKT), UTEE (FEKT)
Rez Jiří, doc. Ing., CSc., UTEE (FEKT)
Abstrakt

The paper deals with the reconstruction of conductivity images on the basis of experimental data. The questions of the data verification and also the verification of new numeric models are
discussed here in detail. Based on the obtained experience, the preconditions of the successful reconstruction are defined here.

Klíčová slova

electrical impedance tomography, finite element method, forward solution, noise level

Rok
2007
Strany
197–198
Sborník
IC - SPETO 2007
Konference
IC-SPETO 2007
ISBN
978-83-85940-29-6
Vydavatel
Wydrukowano w Zakladzie Graficznym Politechniki Slaskiej w Gliwicach
BibTeX
@inproceedings{BUT23698,
  author="Jarmila {Dědková} and Tibor {Bachorec} and Miloslav {Steinbauer} and Jiří {Rez}",
  title="Influence of higher noise level of measured voltages on error of signal reconstruction",
  booktitle="IC - SPETO 2007",
  year="2007",
  pages="197--198",
  publisher="Wydrukowano w Zakladzie Graficznym Politechniki Slaskiej w Gliwicach",
  isbn="978-83-85940-29-6"
}
Pracoviště
Nahoru