Detail výsledku

Leveraging Design Static Analysis for Vertical Reuse in Functional Verification

BARDONEK, P.; ZACHARIÁŠOVÁ, M. Leveraging Design Static Analysis for Vertical Reuse in Functional Verification. 2025 28th Euromicro Conference on Digital System Design (DSD). Salerno, Italy: IEEE, 2025. p. 452-459. ISBN: 979-8-3315-8499-3.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Abstrakt

The Portable Test and Stimulus Standard (PSS) enables higher abstraction for simulation-based verification through graph-based stimulus generation, promoting modular reuse. However, achieving vertical reuse-integrating block-level PSS models into top-level ones-remains a significant challenge due to the manual effort required. This paper introduces static analysis as a critical phase in automating vertical reuse. Static analysis techniques, including data and control flow analyses combined with Satisfiability Modulo Theories solver for conditions resolving, are applied to trace signal paths from the top-level design to its submodules. Experimental validation demonstrates the applicability of the static analysis approach to the execution stage of a RISC-V processor and its scalability and efficiency using a configurable benchmark design with varying design sizes and hierarchical levels. The findings suggest that the static analysis provides enough information about interconnections and dependencies in the top-level design to determine connections necessary for automating the vertical reuse of PSS models.

Klíčová slova

PSS, Digital Design, Static Analysis, Data Flow, Control Flow, SMT, SystemVerilog, Simulation-based Verification

URL
Rok
2025
Strany
452–459
Sborník
2025 28th Euromicro Conference on Digital System Design (DSD)
Konference
28th Euromicro Conference Series on Digital System Design (DSD)
ISBN
979-8-3315-8499-3
Vydavatel
IEEE
Místo
Salerno, Italy
DOI
BibTeX
@inproceedings{BUT193872,
  author="Petr {Bardonek} and Marcela {Zachariášová}",
  title="Leveraging Design Static Analysis for Vertical Reuse in Functional Verification",
  booktitle="2025 28th Euromicro Conference on Digital System Design (DSD)",
  year="2025",
  pages="452--459",
  publisher="IEEE",
  address="Salerno, Italy",
  doi="10.1109/DSD67783.2025.00068",
  isbn="979-8-3315-8499-3",
  url="https://ieeexplore.ieee.org/document/11272820"
}
Projekty
Application-specific HW/SW architectures and their applications, VUT, Vnitřní projekty VUT, FIT-S-23-8141, zahájení: 2023-03-01, ukončení: 2026-02-28, řešení
Pracoviště
Nahoru