Detail výsledku

OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed

MARŠÁLEK, R.; BLUMENSTEIN, J.; POSPÍŠIL, M.; SCHUTZENHOFER, D. OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed. In Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC). New York: IEEE, 2020. p. 1-5. ISBN: 978-1-7281-5478-7.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Maršálek Roman, prof. Ing., Ph.D., REL-SIX (FEKT), UREL (FEKT)
Blumenstein Jiří, doc. Ing., Ph.D., UREL (FEKT)
Schutzenhofer Daniel
Pospíšil Martin, Ing., Ph.D., UREL (FEKT)
Abstrakt

Orthogonal Time Frequency Space (OTFS) modulation has recently been proposed for communication in doubly selective channels. Together with millimeter waves, OTFS seems to be one of the promising candidates for beyond-5G communication systems. In this paper we present the performance of an OTFS system with an Linear Minimum Mean Square Error (LMMSE) equalizer in the presence of main hardware impairments extracted from our millimeter-wave setup in the 60 GHz band.

Klíčová slova

OTFS; millimeter waves; RF impairments

URL
Rok
2020
Strany
1–5
Sborník
Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)
Konference
2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)
ISBN
978-1-7281-5478-7
Vydavatel
IEEE
Místo
New York
DOI
UT WoS
000620337500055
EID Scopus
BibTeX
@inproceedings{BUT165913,
  author="Roman {Maršálek} and Jiří {Blumenstein} and Daniel {Schutzenhofer} and Martin {Pospíšil}",
  title="OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed",
  booktitle="Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)",
  year="2020",
  pages="1--5",
  publisher="IEEE",
  address="New York",
  doi="10.1109/SPAWC48557.2020.9154257",
  isbn="978-1-7281-5478-7",
  url="https://ieeexplore.ieee.org/document/9154257"
}
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