Detail výsledku
Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation
Bartušek Karel, prof. Ing., DrSc., UTEE (FEKT)
Dědková Jarmila, prof. Ing., CSc., UTEE (FEKT)
Kadlec Radim, Ing., Ph.D., UTEE (FEKT)
Dohnal Přemysl, Mgr., UTEE (FEKT)
We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.
Nanomaterials; multilayered material; resonance; periodic system; electromagnetic wave; X-ray; gamma-ray; antireflection; shielding
@article{BUT161036,
author="Pavel {Fiala} and Karel {Bartušek} and Jarmila {Dědková} and Radim {Kadlec} and Přemysl {Dohnal}",
title="Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation",
journal="Measurement Science Review",
year="2019",
volume="19",
number="4",
pages="144--152",
doi="10.2478/msr-2019-0020",
issn="1335-8871",
url="http://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INT"
}