Detail publikace

Formal and Analytical Approaches to the Testability Analysis - the Comparison

KOTÁSEK, Z.; RŮŽIČKA, R.; STRNADEL, J. Formal and Analytical Approaches to the Testability Analysis - the Comparison. Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001. Gyor: SZIF-UNIVERSITAS Ltd., Hungary, 2001. p. 123-128. ISBN: 963-7175-16-4.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Kotásek Zdeněk, doc. Ing., CSc.
Růžička Richard, doc. Ing., Ph.D., MBA (UPSY)
Strnadel Josef, Ing., Ph.D. (UPSY)
Klíčová slova

RTL testability analysis

Abstrakt

The paper deals with two approaches to the RTL testability analysis - formal and analytical ones and their results. The formal approach is based on the theory of set and the predicate logic concepts and algorithms, while the analytical approach applies controllability/observability metrics as a population for genetic algorithm procedures. The reasons for RTL testability analysis are described together with possible solutions. The goal of both methodologies is to utilise the data paths existing in the in the UUA (Unit Under Analysis) to reduce necessary modifications and recommend registers for scan. Possible modifications are discussed from the area overhead point of view.

Rok
2001
Strany
123–128
Sborník
Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001
ISBN
963-7175-16-4
Vydavatel
SZIF-UNIVERSITAS Ltd., Hungary
Místo
Gyor
BibTeX 
@inproceedings{BUT5587,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Josef {Strnadel}",
  title="Formal and Analytical Approaches to the Testability Analysis - the Comparison",
  booktitle="Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001",
  year="2001",
  pages="123--128",
  publisher="SZIF-UNIVERSITAS Ltd., Hungary",
  address="Gyor",
  isbn="963-7175-16-4"
}
Nahoru