Detail publikace

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SEKANINA, L.; FEY, G.; RAIK, J.; AUNET, S.; RŮŽIČKA, R. IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Brno: IEEE Computer Society, 2013. p. 0-0. ISBN: 978-1-4673-6133-0.
Typ
konferenční sborník (ne článek)
Jazyk
anglicky
Autoři
Sekanina Lukáš, prof. Ing., Ph.D. (UPSY)
FEY, G.
RAIK, J.
AUNET, S.
Růžička Richard, doc. Ing., Ph.D., MBA (UPSY)
Abstrakt

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and
Systems provides a forum for exchanging ideas, discussing research results, and
presenting practical applications in the areas of design, test, and diagnosis of
electronic circuits and systems. The DDECS Symposium series has been organized by
these European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998,
2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010),
Germany (2011) and Estonia (2012). DDECS 2013 will take place in Karlovy
Vary (Carlsbad), a historically known spa city located about 140 km west of
Prague. The Symposium is organized by Brno University of Technology, Faculty of
Information Technology, and sponsored by the Test Technology Technical
Council (TTTC) of theIEEE Computer Society.

Rok
2013
Strany
300
Konference
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2013, Karlovy Vary, CZ
ISBN
978-1-4673-6133-0
Vydavatel
IEEE Computer Society
Místo
Brno
BibTeX 
@proceedings{BUT192901,
  editor="SEKANINA, L. and FEY, G. and RAIK, J. and AUNET, S. and RŮŽIČKA, R.",
  title="IEEE 16th International Symposium on Design and Diagnostics of  Electronic Circuits & Systems",
  year="2013",
  pages="300",
  publisher="IEEE Computer Society",
  address="Brno",
  isbn="978-1-4673-6133-0"
}
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