Detail publikace

Applying Process Mining to the Ship Handling Process at Oil Terminal

RUDNITCKAIA, J.; HRUŠKA, T.; NIKDO, N. Applying Process Mining to the Ship Handling Process at Oil Terminal. In Conference on Industrial Cyber Physical Systems. IEEEXplore. Taipei: Institute of Electrical and Electronics Engineers, 2019. p. 552-557. ISBN: 978-1-5386-8500-6.
Název česky
Použití metodu Process Mining na přístavu
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Rudnitckaia Julia, Mgr., Ph.D.
Hruška Tomáš, prof. Ing., CSc. (UIFS)
NIKDO, N.
a další
URL
Klíčová slova

   - Data mining,    - Logistics,    - Measurement,    - Marine vehicles,    - Seaports,    - Context modeling

Abstrakt

Viz. anglickou anotaci o použití metodu na přístavu: Logistics processes are characterized by a high degree of complexity, dynamics, diversity, and human-centricity. The reasons are manifold - product complexity, unexpected events (such as strikes, weather conditions, accidents, etc.), and the high number of participants in the logistics processes. Improving our understanding and making the process more transparent can help to avoid risks and increase performance. The main purpose of this paper is to show a practical application of process mining in the specific domain of seaport terminals. We apply process mining techniques to real port data and discover process models without a priori knowledge. A new framework for the improvement of process mining results using context-aware information in terms of seaports is proposed.

Rok
2019
Strany
552–557
Sborník
Conference on Industrial Cyber Physical Systems
Řada
IEEEXplore
ISBN
978-1-5386-8500-6
Vydavatel
Institute of Electrical and Electronics Engineers
Místo
Taipei
DOI
10.1109/ICPHYS.2019.8780305
UT WoS
000518988100078
EID Scopus
2-s2.0-85070870917
BibTeX 
@inproceedings{BUT159974,
  author="RUDNITCKAIA, J. and HRUŠKA, T. and NIKDO, N.",
  title="Applying Process Mining to the Ship Handling Process at Oil Terminal",
  booktitle="Conference on Industrial Cyber Physical Systems",
  year="2019",
  series="IEEEXplore",
  pages="552--557",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Taipei",
  doi="10.1109/ICPHYS.2019.8780305",
  isbn="978-1-5386-8500-6",
  url="https://ieeexplore.ieee.org/abstract/document/8780305"
}
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