Publication Details

Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

STRNADEL, J.; KOTÁSEK, Z. Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm. Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop. Brno: Brno University of Technology, 2002. p. 44-51. ISBN: 80-214-2094-4.
Czech title
Optimalizace problému scan na úrovni RT založená na genetickém algoritmu
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Kotásek Zdeněk, doc. Ing., CSc.
Keywords

Partial/Full-Scan, Genetic algorithm, Design for testability

Abstract

The paper deals with the problem of selecting registers into a scan chain, the
problem is solved on RT level. As a result of the methodology, it is not only
stated which registers shall be modified into scan registers but also how
registers will be organized into sections, namely how registers will be
subdivided and ordered in sections. The partial scan problem is defined and seen
as a combinatorial problem, a mathematical formula is used to demonstrate it. The
problem of selecting registers for scan chain is solved through genetic
algorithm. The methodology was implemented and verified on DIFFEQ benchmark
circuit. Experimental results are compared with results gained in other
approaches.

Published
2002
Pages
44–51
Proceedings
Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop
ISBN
80-214-2094-4
Publisher
Brno University of Technology
Place
Brno
BibTeX 
@inproceedings{BUT9822,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm",
  booktitle="Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop",
  year="2002",
  pages="44--51",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-214-2094-4",
  url="https://www.fit.vut.cz/research/publication/6897/"
}
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