Publication Details
NAND/NOR Gate Polymorphism in Low Temperature Environment
Polymorphic electronics, temperature-awareness, polymorphic gate, multifunctional
gate
The fundamental aspect behind this paper is focused on behaviour of polymorphic
digital circuits in potentially harsh operating environment. Unlike conventional
CMOS-based circuits, the area of polymorphic electronics takes and an advantage
of inherently built-in features that open up the possibility for on-the-fly
adjustment of a particular circuit function with respect to the surrounding
environment. The most prevalent benefit here is connected with the fact that
space-efficient circuit implementation can be achieved due to the adoption of
polymorphic principles and, thus, eliminate the need for an additional function
change controller. From a conceptual point of view, key attention is given to
a set of experiments which were conducted with the aim to evaluate the influence
of wide temperature range (with special interest in low temperatures domain) in
case of reconfigurable chip with dedicated polymorphic gates. The experimental
setup was based around reconfigurable polymorphic chip REPOMO32, which is
primarily designed to be configured (in addition to the configuration bit stream)
by means of using the level of power supply voltage (Vdd), and carrier board with
all necessary capabilities for temperature measurement up to -40C below zero
boundary and its response analysis. Experiments clearly indicate that polymorphic
gates in the chip can be easily controlled (in terms of functionality) not only
by Vdd, but also by temperature within operating environment. The obtained
results also prove that the physical design of the REPOMO32 chip is robust enough
under wide range of operating temperature, the chip can also be used for future
designs of digital polymorphic circuits controlled by temperature.
@inproceedings{BUT91511,
author="Richard {Růžička} and Václav {Šimek}",
title="NAND/NOR Gate Polymorphism in Low Temperature Environment",
booktitle="Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
year="2012",
pages="34--37",
publisher="Institute of Electrical and Electronics Engineers",
address="Tallinn",
isbn="978-1-4673-1185-4"
}