Publication Details

Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems

STRNADEL, J. Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems. In Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Tallin: IEEE Computer Society, 2012. p. 121-126. ISBN: 978-1-4673-1188-5.
Czech title
HW/SW prevence přetížení vestavných časově kritických systémů systémů z nadměrného počtu přerušení založená na monitorování
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
URL
Keywords

embedded, limiter, interrupt, overload, monitoring, prevention, real-time

Abstract

In the paper, a concept and an early analysis of an embedded hardware/software
architecture designed to prevent the software from both timing disturbances and
interrupt overloads is outlined. The architecture is composed of an FPGA (MCU)
used to run the hardware (software) part of an embedded application. Comparing to
previous approaches, novelty of the architecture can be seen in the fact it is
able to adapt interrupt service rates to the actual software load being monitored
with no intrusion to the software. According to the actual software load it is
able to buffer all interrupts and related data while the software is highly
loaded and redirect the interrupts to the MCU as soon as the software becomes
underloaded.

Published
2012
Pages
121–126
Proceedings
Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Conference
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2012, Tallinn, EE
ISBN
978-1-4673-1188-5
Publisher
IEEE Computer Society
Place
Tallin
DOI
10.1109/DDECS.2012.6219037
UT WoS
000312905700031
BibTeX 
@inproceedings{BUT91462,
  author="Josef {Strnadel}",
  title="Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems",
  booktitle="Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)",
  year="2012",
  pages="121--126",
  publisher="IEEE Computer Society",
  address="Tallin",
  doi="10.1109/DDECS.2012.6219037",
  isbn="978-1-4673-1188-5",
  url="https://www.fit.vut.cz/research/publication/9868/"
}
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