Publication Details

Formal and Analytical Approaches to the Testability Analysis - the Comparison

KOTÁSEK, Z.; RŮŽIČKA, R.; STRNADEL, J. Formal and Analytical Approaches to the Testability Analysis - the Comparison. Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001. Gyor: SZIF-UNIVERSITAS Ltd., Hungary, 2001. p. 123-128. ISBN: 963-7175-16-4.

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)
Strnadel Josef, Ing., Ph.D. (DCSY)

Keywords

RTL testability analysis

Abstract

The paper deals with two approaches to the RTL testability analysis - formal and analytical ones and their results. The formal approach is based on the theory of set and the predicate logic concepts and algorithms, while the analytical approach applies controllability/observability metrics as a population for genetic algorithm procedures. The reasons for RTL testability analysis are described together with possible solutions. The goal of both methodologies is to utilise the data paths existing in the in the UUA (Unit Under Analysis) to reduce necessary modifications and recommend registers for scan. Possible modifications are discussed from the area overhead point of view.

Published

2001

Pages

123–128

Proceedings

Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001

ISBN

963-7175-16-4

Publisher

SZIF-UNIVERSITAS Ltd., Hungary

Place

Gyor

BibTeX

@inproceedings{BUT5587,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Josef {Strnadel}",
  title="Formal and Analytical Approaches to the Testability Analysis - the Comparison",
  booktitle="Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001",
  year="2001",
  pages="123--128",
  publisher="SZIF-UNIVERSITAS Ltd., Hungary",
  address="Gyor",
  isbn="963-7175-16-4"
}