Publication Details

Power Conscious RTL Test Scheduling

ŠKARVADA, J.; KOTÁSEK, Z.; HERRMAN, T. Power Conscious RTL Test Scheduling. Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society, 2008. p. 721-728. ISBN: 978-0-7695-3277-6.
Czech title
RTL plánování testu zohledňující příkon
Type
conference paper
Language
English
Authors
Škarvada Jaroslav, Ing., Ph.D.
Kotásek Zdeněk, doc. Ing., CSc.
Herrman Tomáš, Ing., Ph.D.
Keywords

Test scheduling, testable block, power consumption, test vectors reordering, integer linear programming

Abstract

In the paper, a methodology of power conscious RTL test scheduling is described. The methodology is based on the fact that circuit under analysis (CUA) is partitioned into testable blocks (TB), the information about the partitioning is the input information for the methodology. TBs are mapped into AMI platform, for each TB the sequences of test vectors are then derived, a professional tool is used for this purpose. The sequences of test vectors are then reordered with the goal to reduce power consumption during test application by reducing switching activities. The power consumption estimation is combined with the implemented platform which allows to gain more precise results. The values of TBs power consumption are then used in RTL test scheduling methodology. The goal is to find test schedule with lowest test application time and lower power consumption than the required maximal value.

Published
2008
Pages
721–728
Proceedings
Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools
ISBN
978-0-7695-3277-6
Publisher
IEEE Computer Society
Place
Los Alamitos
BibTeX
@inproceedings{BUT30497,
  author="Jaroslav {Škarvada} and Zdeněk {Kotásek} and Tomáš {Herrman}",
  title="Power Conscious RTL Test Scheduling",
  booktitle="Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools",
  year="2008",
  pages="721--728",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  isbn="978-0-7695-3277-6",
  url="https://www.fit.vut.cz/research/publication/8700/"
}
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