Publication Details

Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis

STRNADEL, J. Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis. In Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2007. p. 333-338. ISBN: 978-80-214-3470-7.
Czech title
Sada nástrojů pro experimentování s optimalizacemi v oblasti kompromisu mezi cenou a kvalitou návrhu pro snadnou testovatelnost číslicových obvodů
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Keywords

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Abstract

The paper presents a toolset utilizable for learning and training principles related to design-for-testability of digital systems by means of structural and ad-hoc techniques. Actually, the toolset consists of two tools named SET and CADeT. Using the tools, user is allowed to make experiments in the optimization area which goal is to achieve feasible cost/quality trade-off among design-constraints and diagnostic requirements posed on a digital system. In the paper, basic education-related characteristics of the tools are briefly presented.

Published
2007
Pages
333–338
Proceedings
Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference
ISBN
978-80-214-3470-7
Publisher
Brno University of Technology
Place
Brno
BibTeX 
@inproceedings{BUT28819,
  author="Josef {Strnadel}",
  title="Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis",
  booktitle="Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference",
  year="2007",
  pages="333--338",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3470-7"
}
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