Publication Details

Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method

STRNADEL, J. Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method. Proceedings of Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2008. p. 367-372. ISBN: 978-80-214-3717-3.
Czech title
Zlepšení testovatelnosti víceúrovňových návrhů řízené analýzou testovatelnosti
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
URL
Keywords

digital, circuit, design, testability, multilevel, enhancement, guidance

Abstract

In the paper, multilevel extension of previously published register-transfer level testability analysis method is presented. It is illustrated how libraries and net-lists of multilevel designs can be described in special language developed for the purpose, how the method can be linked up to commercial electronic design automation tools and how information offered by the method can be utilized for guidance during testability enhancement of digital designs.

Published
2008
Pages
367–372
Proceedings
Proceedings of Electronic Devices and Systems IMAPS CS International Conference
ISBN
978-80-214-3717-3
Publisher
Brno University of Technology
Place
Brno
BibTeX 
@inproceedings{BUT27713,
  author="Josef {Strnadel}",
  title="Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference",
  year="2008",
  pages="367--372",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3717-3",
  url="https://www.fit.vut.cz/research/publication/8631/"
}
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