Optimalizace plánování testu číslicových systémů vzhledem k příkonu

test schedule, testing, power consumption, test schedule optimization, digital circuit

The paper deals with the test scheduling optimization for digital systems. There can be two modes of operation detected in digital systems - normal operation mode and test mode. As proven by experiments in the test mode there is generally higher power consumption than in normal operation mode. By using appropriate test scheduling methods it is possible to lower power consumption during the test to the acceptable level. In practice these methods could be used for digital systems powered from batteries and for digital systems with high level of integration and limited cooling capabilities.