Publication Details
FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties
benchmark, synthetic, RTL, testability
In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is
presented for the evaluation of diagnostic methods and tools. The structure of
benchmark circuits together with their diagnostic properties is described. The
set consists of 31 circuits at various levels of complexity (2000, 10000, 28000,
100000, 150000 and 300000 gates). Four circuits with different diagnostic
properties are available for each level of circuit complexity (fault coverage is
approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the
register transfer level and the gate level. In addition to the benchmark set,
a method is described that was used to develop benchmark circuits with required
complexity and diagnostic properties.
@inproceedings{BUT22205,
author="Tomáš {Pečenka} and Zdeněk {Kotásek} and Lukáš {Sekanina}",
title="FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties",
booktitle="Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop",
year="2006",
pages="285--289",
publisher="IEEE Computer Society",
address="Praha",
isbn="1424401844"
}