Publication Details

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

KOTÁSEK, Z.; STRNADEL, J. SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System. Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS). Los Alamitos, CA: IEEE Computer Society, 2006. p. 497-498. ISBN: 0-7695-2546-6.

Czech title

SET: Interaktivní nástroj pro výuku a procvičování principů scan DFT technik a jejich vlivu na parametry vestavěných systémů

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.
Strnadel Josef, Ing., Ph.D. (DCSY)

Keywords

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Abstract

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Published

2006

Pages

497–498

Proceedings

Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)

ISBN

0-7695-2546-6

Publisher

IEEE Computer Society

Place

Los Alamitos, CA

BibTeX

@inproceedings{BUT22181,
  author="Zdeněk {Kotásek} and Josef {Strnadel}",
  title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System",
  booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)",
  year="2006",
  pages="497--498",
  publisher="IEEE Computer Society",
  address="Los Alamitos, CA",
  isbn="0-7695-2546-6"
}