Publication Details

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SEKANINA, L.; FEY, G.; RAIK, J.; AUNET, S.; RŮŽIČKA, R. IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Brno: IEEE Computer Society, 2013. p. 0-0. ISBN: 978-1-4673-6133-0.
Type
conference proceedings
Language
English
Authors
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
FEY, G.
RAIK, J.
AUNET, S.
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)
Abstract

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011) and Estonia (2012). DDECS 2013 will take place in Karlovy Vary (Carlsbad), a historically known spa city located about 140 km west of Prague. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of theIEEE Computer Society.

Published
2013
Pages
300
Conference
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2013, Karlovy Vary, CZ
ISBN
978-1-4673-6133-0
Publisher
IEEE Computer Society
Place
Brno
BibTeX 
@proceedings{BUT192901,
  editor="SEKANINA, L. and FEY, G. and RAIK, J. and AUNET, S. and RŮŽIČKA, R.",
  title="IEEE 16th International Symposium on Design and Diagnostics of  Electronic Circuits & Systems",
  year="2013",
  pages="300",
  publisher="IEEE Computer Society",
  address="Brno",
  isbn="978-1-4673-6133-0"
}
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