Publication Details

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V. 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Kliece: Institute of Electrical and Electronics Engineers, 2024. p. 0-0. ISBN: 979-8-3503-5934-3.
Czech title
24. mezinárodní sympozium o návrhu a diagnostice elektronických obvodů a systémů
Type
conference proceedings
Language
English
Authors
DENIZIAK, S.
SITEK, P.
JENIHHIN, M.
Steininger Andreas, Prof. Dr.
SCHÖLZEL, M.
Mrázek Vojtěch, Ing., Ph.D. (DCSY)
URL
Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Published
2024
Pages
155
ISBN
979-8-3503-5934-3
Publisher
Institute of Electrical and Electronics Engineers
Place
Kliece
DOI
10.1109/DDECS60919.2024
BibTeX 
@proceedings{BUT188622,
  editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.",
  title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2024",
  pages="155",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Kliece",
  doi="10.1109/DDECS60919.2024",
  isbn="979-8-3503-5934-3",
  url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803"
}
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