Publication Details

Survey of Partial Scan Methodologies

KOTÁSEK, Z. Survey of Partial Scan Methodologies. Research and Training Action for System on Chip Design, 5th FP Project. Bratislava: Slovak Academy of Science, 2004. p. 1-77.
Czech title
Přehled metodik typu Partial Scan
Type
conference paper
Language
English
Authors
Kotásek Zdeněk, doc. Ing., CSc.
Keywords

digital circuit testability, test application

Abstract

Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.

Published
2004
Pages
1–77
Proceedings
Research and Training Action for System on Chip Design, 5th FP Project
Publisher
Slovak Academy of Science
Place
Bratislava
BibTeX
@inproceedings{BUT17574,
  author="Zdeněk {Kotásek}",
  title="Survey of Partial Scan Methodologies",
  booktitle="Research and Training Action for System on Chip Design, 5th FP Project",
  year="2004",
  pages="1--77",
  publisher="Slovak Academy of Science",
  address="Bratislava"
}
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