Publication Details

Partial Scan Methodologoies

KOTÁSEK, Z. Partial Scan Methodologoies. Research and Training Action for System on Chip Design, 5th FP Project. Bratislava: Slovak Academy of Science, 2004. p. 1-77.

Czech title

Přehled metodik typu Partial Scan

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.

Keywords

digital circuit testability, test application

Abstract

Partial scan methodologies are seen as an alternative to applying atest to a digital circuit. In the presentation a survey of themethodologies is given.

Published

2004

Pages

1–77

Proceedings

Research and Training Action for System on Chip Design, 5th FP Project

Publisher

Slovak Academy of Science

Place

Bratislava

BibTeX

@inproceedings{BUT17574,
  author="Zdeněk {Kotásek}",
  title="Partial Scan Methodologoies",
  booktitle="Research and Training Action for System on Chip Design, 5th FP Project",
  year="2004",
  pages="1--77",
  publisher="Slovak Academy of Science",
  address="Bratislava"
}