Publication Details

24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V. 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. USA: Institute of Electrical and Electronics Engineers, 2021. p. 0-0. ISBN: 978-1-6654-3595-6.
Czech title
24. mezinárodní sympozium o návrhu a diagnostice elektronických obvodů a systémů
Type
conference proceedings
Language
English
Authors
Shafique Muhammad
Steininger Andreas, Prof. Dr.
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
KRSTIĆ, M.
STOJANOVIC, G.
Mrázek Vojtěch, Ing., Ph.D. (DCSY)
Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Abstract

This proceedings contains reviewed papers accepted for publication and
presentation at the 24th International Symposium on Design and Diagnostics of
Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has
continued to provide a forum for exchanging ideas, discussing research results,
and presenting practical applications in the areas of design, test, and diagnosis
of electronic circuits and systems.

Published
2021
Pages
158
Conference
24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Vídeň, AT
ISBN
978-1-6654-3595-6
Publisher
Institute of Electrical and Electronics Engineers
Place
USA
DOI
10.1109/DDECS52668.2021.9417019
EID Scopus
2-s2.0-85105554198
BibTeX 
@proceedings{BUT171158,
  editor="SHAFIQUE, M. and STEININGER, A. and SEKANINA, L. and KRSTIĆ, M. and STOJANOVIC, G. and MRÁZEK, V.",
  title="24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2021",
  pages="158",
  publisher="Institute of Electrical and Electronics Engineers",
  address="USA",
  doi="10.1109/DDECS52668.2021.9417019",
  isbn="978-1-6654-3595-6"
}
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