Publication Details
24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
SHAFIQUE, M.; STEININGER, A.; SEKANINA, L.; KRSTIĆ, M.; STOJANOVIC, G.; MRÁZEK, V. 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. USA: Institute of Electrical and Electronics Engineers, 2021. p. 0-0. ISBN: 978-1-6654-3595-6.
Czech title
24. mezinárodní sympozium o návrhu a diagnostice elektronických obvodů a systémů
Type
conference proceedings
Language
English
Authors
Shafique Muhammad
(FIT)
Steininger Andreas, Prof. Dr.
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
KRSTIĆ, M.
STOJANOVIC, G.
Mrázek Vojtěch, Ing., Ph.D. (DCSY)
Steininger Andreas, Prof. Dr.
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY)
KRSTIĆ, M.
STOJANOVIC, G.
Mrázek Vojtěch, Ing., Ph.D. (DCSY)
Keywords
electronic circuit, design, test, design method, digital circuit, analog circuit
Abstract
This proceedings contains reviewed papers accepted for publication and presentation at the 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2021). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.
Published
2021
Pages
158
ISBN
978-1-6654-3595-6
Publisher
Institute of Electrical and Electronics Engineers
Place
USA
DOI
EID Scopus
BibTeX
@proceedings{BUT171158,
editor="SHAFIQUE, M. and STEININGER, A. and SEKANINA, L. and KRSTIĆ, M. and STOJANOVIC, G. and MRÁZEK, V.",
title="24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
year="2021",
pages="158",
publisher="Institute of Electrical and Electronics Engineers",
address="USA",
doi="10.1109/DDECS52668.2021.9417019",
isbn="978-1-6654-3595-6"
}