Publication Details

Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study

PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study. In 2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers. Hsinchu: IEEE Computer Society, 2020. p. 121-124. ISBN: 978-1-7281-6083-2.
Czech title
Spolehlivostní analýza řadiče rekonfigurace pro systémy odolné proti poruchám: případová studie
Type
conference paper
Language
English
Authors
Pánek Richard, Ing., Ph.D. (DCSY)
Lojda Jakub, Ing., Ph.D. (DCSY)
Podivínský Jakub, Ing., Ph.D. (UFYZ)
Kotásek Zdeněk, doc. Ing., CSc.
Keywords

Fault-Tolerant, Partial Dynamic Reconfiguration Controller, Fault Tolerance
Property Estimation, FT-EST

Abstract

This paper deals with a reliability analysis of a reconfiguration controller
which can be a component of a fault-tolerant control system. This controller is
designed for an FPGA to be capable of using partial dynamic reconfiguration of
the FPGA to mitigate potential faults in the FPGAs configuration memory. These
faults, which are called SEUs, can be induced by radiation effects. Therefore,
fault tolerance measurement or estimation is very important for designing
circuits for critical environments. Thus, the reliability of the reconfiguration
controller itself is significant; therefore the Fault Tolerance ESTimation
(FT-EST) framework is used for reliability evaluation, which is procured by the
discovery of a number of critical configuration bits. Two approaches are used and
compared: evaluations of used LUT only, and evaluations of all configuration
bits. We ascertained a 20x reduction in time consumption at the expense of
a proportional decrease in the amount of critical configuration bits discovered.
The obtained results are nearly equivalent.

Published
2020
Pages
121–124
Proceedings
2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers
Conference
2020 International Symposium on VLSI Design, Automation and Test, Ambassador Hotel, Hsinchu, Taiwan, TW
ISBN
978-1-7281-6083-2
Publisher
IEEE Computer Society
Place
Hsinchu
DOI
UT WoS
000612045400011
EID Scopus
BibTeX
@inproceedings{BUT168116,
  author="Richard {Pánek} and Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}",
  title="Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study",
  booktitle="2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers",
  year="2020",
  pages="121--124",
  publisher="IEEE Computer Society",
  address="Hsinchu",
  doi="10.1109/VLSI-DAT49148.2020.9196269",
  isbn="978-1-7281-6083-2",
  url="https://www.fit.vut.cz/research/publication/12101/"
}
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