Publication Details

Statistical Model Checking of Approximate Circuits: Challenges and Opportunities

STRNADEL, J. Statistical Model Checking of Approximate Circuits: Challenges and Opportunities. In Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). Grenoble: IEEE Computer Society, 2020. p. 1574-1577. ISBN: 978-3-9819263-4-7.
Czech title
Statistické ověřování modelů aproximativních obvodů: výzvy a příležitosti
Type
conference paper
Language
English
Authors
URL
Keywords

approximate circuit, error, trade-off, relaxed equivalence, formal verification,
timed automaton, stochastic automaton, modeling, simulation, statistical model
checking

Abstract

Many works have shown that approximate circuits may play an important role in the
development of resource-efficient electronic systems. This motivates many
researchers to propose new approaches for finding an optimal trade-off between
the approximation error and resource savings for predefined applications of
approximate circuits. The works and approaches, however, focus mainly on design
aspects regarding relaxed functional requirements while neglecting further
aspects such as signal and parameter dynamics/stochasticity,
relaxed/non-functional equivalence, testing or formal verification. This paper
aims to take a step ahead by moving towards the formal verification of
time-dependent properties of systems based on approximate circuits. Firstly, it
presents our approach to modeling such systems by means of stochastic timed
automata whereas our approach goes beyond digital, combinational and/or
synchronous circuits and is applicable in the area of sequential, analog and/or
asynchronous circuits as well. Secondly, the paper shows the principle and
advantage of verifying properties of modeled approximate systems by the
statistical model checking technique. Finally, the paper evaluates our approach
and outlines future research perspectives.

Published
2020
Pages
1574–1577
Proceedings
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Conference
Design, Automation and Test in Europe Conference, Grenoble, FR
ISBN
978-3-9819263-4-7
Publisher
IEEE Computer Society
Place
Grenoble
DOI
UT WoS
000610549200286
EID Scopus
BibTeX
@inproceedings{BUT162083,
  author="Josef {Strnadel}",
  title="Statistical Model Checking of Approximate Circuits: Challenges and Opportunities",
  booktitle="Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)",
  year="2020",
  pages="1574--1577",
  publisher="IEEE Computer Society",
  address="Grenoble",
  doi="10.23919/DATE48585.2020.9116207",
  isbn="978-3-9819263-4-7",
  url="https://ieeexplore.ieee.org/document/9116207"
}
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