Publication Details

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

STRNADEL, J. Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability. Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznan: Publishing House of Poznan University of Technology, 2003. p. 303-304. ISBN: 83-7143-557-6.
Czech title
Algebraická analýza závislostí zpětnovazebních smyček vedoucí ke zlepšení testovatelnosti RTL číslicových obvodů
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Keywords

Feedback vertex set problem, feedback arc set problem, loop coverage, loop dependencies, algebraic analysis, linear algebra, matrix operations

Abstract

The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.

Published
2003
Pages
303–304
Proceedings
Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
ISBN
83-7143-557-6
Publisher
Publishing House of Poznan University of Technology
Place
Poznan
BibTeX 
@inproceedings{BUT13959,
  author="Josef {Strnadel}",
  title="Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability",
  booktitle="Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  year="2003",
  pages="303--304",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznan",
  isbn="83-7143-557-6",
  url="https://www.fit.vut.cz/research/publication/7160/"
}
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