Publication Details
Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level
Kotásek Zdeněk, doc. Ing., CSc.
design for testability, scan technique, scan register, scan chain, state-space
analysis, evolutionary approach, genetic algorithm
In the paper a new heuristic approach to the RTL testability analysis is
presented. It is shown how the values of controllability/observability factors
reflecting the structure of the circuit and other factors can be utilised to find
solutions which are sub-optimal but still acceptable for the designer. The goal
of the methodology is to enable the identification of such testability solutions
which satisfy concrete requirements in terms of the number of registers included
into the scan chain, the area overhead and the test application time as a result
of RTL testability analysis. The approach is based on the combination of
analytical and evolutionary approaches at the RT level.
@inproceedings{BUT10243,
author="Josef {Strnadel} and Zdeněk {Kotásek}",
title="Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level",
booktitle="Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002",
year="2002",
pages="166--173",
publisher="IEEE Computer Society Press",
address="Los Alamitos",
isbn="0-7695-1790-0",
url="https://www.fit.vut.cz/research/publication/6980/"
}