Result Details

Calculation of sensitivities in two-dimmensional electrical impedance tomography

VALSA, J., DĚDKOVÁ, J., DĚDEK, L. Calculation of sensitivities in two-dimmensional electrical impedance tomography. In 26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003. Gliwice: Silesian University of Technology, 2003. 3 p. ISBN: 83-85940-25-1.
Type
conference paper
Language
English
Authors
Valsa Juraj, prof. Ing., CSc.
Dědková Jarmila, prof. Ing., CSc.
Dědek Libor, prof. Ing., CSc.
Abstract

Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.

Keywords

Electrical impedance tomography, sensitivity, finite element method

Published
2003
Pages
3
Proceedings
26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003
Conference
26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003
ISBN
83-85940-25-1
Publisher
Silesian University of Technology
Place
Gliwice
BibTeX 
@inproceedings{BUT8442,
  author="Juraj {Valsa} and Jarmila {Dědková} and Libor {Dědek}",
  title="Calculation of sensitivities in two-dimmensional electrical impedance tomography",
  booktitle="26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003",
  year="2003",
  pages="3",
  publisher="Silesian University of Technology",
  address="Gliwice",
  isbn="83-85940-25-1"
}
Departments
Ústav teoretické a experimentální elektrotechniky (UTEE)
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