Result Details
Non-Destructive Testing for Cracks in Special Conductive Materials
DĚDKOVÁ, J. Non-Destructive Testing for Cracks in Special Conductive Materials. Studies in Computational Intelligence, Springer Berlin / Heidelberg, 2008, vol. 2008, no. 119, p. 299-303. ISSN: 1860-9503.
Type
journal article
Language
English
Authors
Dědková Jarmila, prof. Ing., CSc., UTEE (FEEC)
Abstract
In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.
Keywords
honeycombs, electric impedance tomography,
Published
2008
Pages
299–303
Journal
Studies in Computational Intelligence, Springer Berlin / Heidelberg, vol. 2008, no. 119, ISSN 1860-9503
Conference
International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering
Publisher
Springer Berlin
Place
Heidelberg
Deutschland
BibTeX
@article{BUT48405,
author="Jarmila {Dědková}",
title="Non-Destructive Testing for Cracks in Special Conductive Materials",
journal="Studies in Computational Intelligence, Springer Berlin / Heidelberg",
year="2008",
volume="2008",
number="119",
pages="299--303",
issn="1860-9503"
}
Departments