Combination of deterministic and stochastic approaches to the image reconstruction

In this paper is described a new algorithm based on the combination of deterministic and stochastic approaches to the reconstruction process of the surface conductivity distribution to obtain the best results. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identification of cracks in special structures called honeycombs.