Result Details

Effective defect identifications in honeycombs

DĚDKOVÁ, J. Effective defect identifications in honeycombs. Advances in Electrical and Electronic Engineering, 2008, vol. 08, no. 7, p. 301-304. ISSN: 1336-1376.
Type
journal article
Language
English
Authors
Abstract

The image reconstruction problem based on Electrical Impedance Tomography (EIT) is an ill-posed inverse problem of finding such conductivity distribution that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms for the reconstruction of the surface conductivity distribution, which are based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. There are shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experimental data we used the phantom evaluated voltage values based on the application of finite element method. The results obtained by this new approach are compared with results from the known deterministic approach to the same image reconstruction.

Keywords

image reconstruction, electrical impedance tomography, EIT

Published
2008
Pages
301–304
Journal
Advances in Electrical and Electronic Engineering, vol. 08, no. 7, ISSN 1336-1376
Conference
Elektro 2008
Publisher
University of Žilina
Place
Slovakia
BibTeX
@article{BUT47950,
  author="Jarmila {Dědková}",
  title="Effective defect identifications in honeycombs",
  journal="Advances in Electrical and Electronic Engineering",
  year="2008",
  volume="08",
  number="7",
  pages="301--304",
  issn="1336-1376"
}
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