Result Details

Identification of defects in materials

BACHOREC, T.; DĚDKOVÁ, J. Identification of defects in materials. In Proceedings of the Internation Workshop ISEP-DTEE 2006. 2006. p. 35-36. ISBN: 80-214-3250-0.
Type
conference paper
Language
English
Authors
Bachorec Tibor, Ing., Ph.D., UTEE (FEEC)
Dědková Jarmila, prof. Ing., CSc., UTEE (FEEC)
Abstract

In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material.

Keywords

Impedance tomography, inverse problem, non-destructive testing

Published
2006
Pages
35–36
Proceedings
Proceedings of the Internation Workshop ISEP-DTEE 2006
Conference
International Workshop ISEP - DTEE 3.- 6. 9.2006 Paris
ISBN
80-214-3250-0
BibTeX 
@inproceedings{BUT24375,
  author="Tibor {Bachorec} and Jarmila {Dědková}",
  title="Identification of defects in materials",
  booktitle="Proceedings of the Internation Workshop ISEP-DTEE 2006",
  year="2006",
  pages="35--36",
  isbn="80-214-3250-0"
}
Departments
Ústav teoretické a experimentální elektrotechniky (UTEE)
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